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Welcome to Insurface - the whole world of sorption measuring - in one hand
characterisation of catalyst  magnetic suspension balance  pulse adsorption  sorption isotherm  vapor adsorption 
www.insurface.com - 2009-02-07
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Microscopy Advantage is an off-line resource for workers in microscopy and microanalysis. It contains many of the most often asked for websites by end users in ...
off-line resource. 
www.microscopy-advantage.com - 2009-02-04
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Kratos manufactures XPS (ESCA), reflectron MALDI TOF, XRD, and XRF instruments for research and routine use and their data systems
www.kratos.com - 2009-02-07
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BESTEC GmbH - Your Competent Partner in Vacuum Technology - specialised in design and manufacturing of vacuum systems for applications in surface analysis & ...
Oberflchenanalytik-System  OMBD  Sputteranlage 
www.bestec.de - 2009-01-28
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Gallium LMIG  Liquid metal ion sources  quadrupole sims  sector sims 
www.ionoptika.com - 2009-02-07
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Surface analysis specialized company (esca, tof-sims, afm, ftir, contact angle, permeation) and plasma treatments (pecvd)
atomic composition  biophy  biophy research  bonding composition  molecular fragment  rugosity  tof sims 
www.biophyresearch.com - 2009-02-07
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Winnats provides access to a wide range of industry respected expertise in surface analysis and related analytical techniques, with more than 25 years of ...
www.winnats.co.uk - 2009-04-09
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Winnats provides access to a wide range of industry respected expertise in surface analysis and related analytical techniques, with more than 25 years of ...
www.winnats.com - 2009-02-06
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商品情報 企業情報 ニュース イベント 環境保全 カスタマーサービス ユーザー様へのお知らせ アプリケーション 採用情報 HOME お問い合わせ サイトマップ 個人情報保護方針 リンク English What's New 2009.02.10 イベント情報を更新しました 2008.12.22 カスタマーサービス部 ...
アルバックファイ 
www.ulvac-phi.com - 2009-02-10
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The technology presented in Image Analysis Sourcebook has direct application in processing, biology, medical sciences, earth sciences, microscopy, imaging, ...
characterization vector  flake analysis  grand radial distribution  invariant image descriptors  measurement vector  microstructure analysis  partial symmetry  principle axis transformation  R theta plot  shape features  standard for shape  standard for size  standardization of measurement  statistical features  uniangle 
www.morphologyanalysis.com - 2009-02-13
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